NEW WIDE-BAND OPTICAL MODULATION METHOD FOR MEASUREMENT OF INTRINSIC FREQUENCY-RESPONSE IN SEMICONDUCTOR-LASERS

被引：1
|
作者：
MURATA, S
SUZUKI, A
机构：
[1] Opto-Electronics Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba
来源：
ELECTRONICS LETTERS | 1992年 / 28卷 / 23期
关键词：
SEMICONDUCTOR LASERS; OPTICAL MODULATION;
D O I：
10.1049/el:19921388
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new wideband optical modulation method is described for measurement of the intrinsic frequency response in semiconductor lasers. The measurement bandwidth is more than 40 GHz. The main feature of the method is the detection technique which uses a microwave detector and a lock-in amplifier. The 3 dB modulation bandwidth for a 1.5 mum strained multiquantum well laser measured by this method is 28 GHz.
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页码：2162 / 2163
页数：2
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