ANALYSIS OF SURFACE STRUCTURAL DEFECTS BY LOW-ENERGY ELECTRON-DIFFRACTION

被引：11

|

作者：

WELKIE, DG

LAGALLY, MG

机构：

[1] UNIV WISCONSIN,CTR MAT SCI,MADISON,WI 53706

[2] UNIV WISCONSIN,DEPT MET & MIN ENGN,MADISON,WI 53706

来源：

THIN SOLID FILMS | 1982年 / 93卷 / 3-4期

关键词：

D O I：

10.1016/0040-6090(82)90128-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：219 / 234

页数：16

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