OPTICAL CHARACTERIZATION AND BAND OFFSETS IN ZNSE-ZNSXSE1-X STRAINED-LAYER SUPERLATTICES

被引：188
|
作者：
SHAHZAD, K [1 ]
OLEGO, DJ [1 ]
VAN DE WALLE, CG [1 ]
机构：
[1] IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
来源：
PHYSICAL REVIEW B | 1988年 / 38卷 / 02期
关键词：
D O I：
10.1103/PhysRevB.38.1417
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：1417 / 1426
页数：10
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