SCANNING-TRANSMISSION ELECTRON-MICROSCOPY OF THIN SPECIMENS - COMMENT

被引：1

|

作者：

DEKKERS, NH

DELANG, H

机构：

来源：

ULTRAMICROSCOPY | 1978年 / 3卷 / 01期

关键词：

D O I：

10.1016/S0304-3991(78)80014-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：101 / 102

页数：2

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