FAILURE PHYSICS APPROACH TO IC RELIABILITY

被引：6
|
作者：
FARROW, RH
PARKER, GW
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1972年 / 11卷 / 02期
关键词：
D O I：
10.1016/0026-2714(72)90697-X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：151 / &
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