ATOMIC-FORCE MICROSCOPY OF THIN TRIBLOCK COPOLYMER FILMS

被引：47

作者：

VANDENBERG, R ^{[1
]}

DEGROOT, H ^{[1
]}

VANDIJK, MA ^{[1
]}

DENLEY, DR ^{[1
]}

机构：

[1] SHELL DEV CO,WESTHOLLOW RES CTR,HOUSTON,TX 77251

来源：

POLYMER | 1994年 / 35卷 / 26期

关键词：

ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMER; MORPHOLOGY;

D O I：

10.1016/S0032-3861(05)80056-4

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

We report the elucidation of the surface morphology of a number of ABA triblock copolymers by atomic force microscopy (AFM). The chemical nature of the different phases observed in the image and the size of the respective domains was determined by image analysis. In this way the various features of the domain structure could be quantitatively determined and related to theory.

引用

页码：5778 / 5781

页数：4

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