METHOD OF COMBINED TSL AND TSC MEASUREMENTS TO DETERMINE PARAMETERS OF TRAPS

被引:0
|
作者
BIRKLE, GVB [1 ]
GAVRILOV, FF [1 ]
KITAYEV, GA [1 ]
机构
[1] SM KIROV POLYTECH INST,SVERDLOVSK,USSR
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:94 / 101
页数:8
相关论文
共 50 条
  • [1] CORRELATION IN SIMULTANEOUS TSC AND TSL MEASUREMENTS
    GASIOT, J
    FILLARD, JP
    JOURNAL OF APPLIED PHYSICS, 1977, 48 (07) : 3171 - 3172
  • [2] ON THE PEAK SHAPE METHOD FOR THE DETERMINATION OF ACTIVATION-ENERGY IN TSL AND TSC
    GARTIA, RK
    SINGH, SJ
    SINGH, TSC
    MAZUMDAR, PS
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1993, 26 (04) : 694 - 696
  • [3] A SIMPLE METHOD OF EVALUATION OF TSC MEASUREMENTS
    KLIER, E
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1981, 67 (02): : K151 - K154
  • [4] Combined Method of Radar Measurements of Surface Current Parameters
    M. D. Raev
    E. I. Skvortsov
    Izvestiya, Atmospheric and Oceanic Physics, 2021, 57 : 1789 - 1793
  • [5] Combined Method of Radar Measurements of Surface Current Parameters
    Raev, M. D.
    Skvortsov, E., I
    IZVESTIYA ATMOSPHERIC AND OCEANIC PHYSICS, 2021, 57 (12) : 1789 - 1793
  • [6] Evaluation of Energy Depth of Traps in PA/BaTiO3 Composite Film by TSC Measurements
    Yoshiura, Masahiko
    Yoshida, Fukuzo
    Ohta, Tsukasa
    PROCEEDINGS OF THE 2010 IEEE INTERNATIONAL CONFERENCE ON SOLID DIELECTRICS (ICSD 2010), 2010,
  • [7] CONSTANT-TEMPERATURE METHOD FOR EVALUATING DEEP-LEVEL PARAMETERS IN SCHOTTKY-BARRIER TSC MEASUREMENTS
    SMITH, BL
    CARTER, MA
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (03) : 254 - 261
  • [8] A METHOD FOR DETERMINING THE DENSITY OF DEEP TRAPS BY USING THE SIMULTANEOUS TL/TSC MEASUREMENT TECHNIQUE
    MANDOWSKI, A
    SWIATEK, J
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1992, 25 (12) : 1829 - 1833
  • [9] A method to determine the minimum number of litter traps in litterfall studies
    Finotti, R
    Freitas, SR
    Cerqueira, R
    Vieira, MV
    BIOTROPICA, 2003, 35 (03) : 419 - 421
  • [10] A new method of determination of parameters of traps in semiconductors
    Aroutiounian, VM
    Bouniatian, VV
    Gevorgian, SS
    Soukiassian, P
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1998, 210 (02): : 805 - 808