A CONTRAST REVERSAL EFFECT IN SCANNING AUGER MICROSCOPY

被引：0
|
作者：
ELGOMATI, MM [1 ]
WALKER, CGH [1 ]
机构：
[1] UNIV YORK, DEPT ELECTR, YORK YO1 5DD, N YORKSHIRE, ENGLAND
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1988年 / 93期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
An effect which can cause contrast reversals in Scanning Auger Microscope images is demonstrated. This effect is caused by the secondary electron background changing by different amounts on different materials. The effect can be overcome by taking better account of the nature of the background by imaging on several points above and below the Auger peak.
引用
收藏
页码：277 / 278
页数：2
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