ELECTRON-MICROSCOPIC INVESTIGATION OF SILICON LAYERS GROWN BY SUBLIMATION IN VACUUM

被引：0

作者：

KUZNETSOV, VP

TOLOMASOV, VA

SHMENINA, TM

GUDKOVA, NV

机构：

来源：

KRISTALLOGRAFIYA | 1978年 / 23卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：662 / 663

页数：2

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