ANNEALING BEHAVIOR OF NEUTRON-IRRADIATED SILICON-CARBIDE TEMPERATURE MONITORS

被引：43
|
作者：
PRICE, RJ
机构：
来源：
NUCLEAR TECHNOLOGY | 1972年 / 16卷 / 03期
关键词：
D O I：
10.13182/NT72-A31222
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
引用
收藏
页码：536 / &
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