PREPARATION OF ZIRCONIA-PILLARED SYNTHETIC FLUOROHECTORITE HAVING A INTERLAYER DISTANCE OF 20-ANGSTROM

被引：0
|
作者：
SUZUKI, K
MORI, T
机构：
[1] National Industrial Research Institute of Nagoya, Hirate-cho, Kita-ku
来源：
NIPPON KAGAKU KAISHI | 1994年 / 11期
关键词：
D O I：
10.1246/nikkashi.1994.1030
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Synthetic fluorohectorite was pillared with zirconia in the presence of poly(vinyl alcohol) (PVA). The interlayer distance of the prepared clay was determined by X-ray powder diffraction; the interlayer distance was 20 Angstrom in contrast to 2.4 Angstrom for raw clay. The nitrogen adsorption isotherm observed was in agreement with BET equation, indicating that the pore formed in the synthetic fluorohectorite was large enough to assure the multi-layer adsorption of nitrogen. The pore size distribution determined from the parallel plate pore model; the main distance between the plates was ca. 18 Angstrom. It was found that pillaring in the presence of PVA resulted in a preparation of zirconia-pillared synthetic fluorohectorite having a interlayer distance of 20 Angstrom.
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页码：1030 / 1032
页数：3
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