EFFECT OF STRUCTURAL DISORDER ON ELECTRICAL STRENGTH OF GLASSY QUARTZ THIN FILMS

被引:0
|
作者
KORZO, VF
机构
来源
SOVIET PHYSICS SOLID STATE,USSR | 1971年 / 13卷 / 06期
关键词
D O I
暂无
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:1311 / +
页数:1
相关论文
共 50 条
  • [1] Electrical glassy behavior in granular aluminium thin films
    Delahaye, Julien
    Grenet, Thierry
    PHYSICA B-CONDENSED MATTER, 2009, 404 (3-4) : 470 - 472
  • [2] Electrical strength of thin polyaniline films
    Kuzmin, S. V.
    Saha, P.
    Sudar, N. T.
    Zakrevskii, V. A.
    Sapurina, I.
    Solosin, S.
    Trchova, M.
    Stejskal, J.
    THIN SOLID FILMS, 2008, 516 (08) : 2181 - 2187
  • [3] LOW-TEMPERATURE BREAKDOWN OF VERY THIN FILMS OF GLASSY QUARTZ
    KORZO, VF
    SOVIET PHYSICS SOLID STATE,USSR, 1969, 11 (02): : 328 - +
  • [4] APPEARANCE OF A PLASMA INSTABILITY DURING BREAKDOWN OF THIN-FILMS OF GLASSY QUARTZ
    KORZO, VF
    SOVIET PHYSICS SOLID STATE,USSR, 1972, 13 (08): : 2065 - +
  • [5] Effect of island coalescence on structural and electrical properties of InN thin films
    Lebedev, V.
    Cimalla, V.
    Morales, F. M.
    Lozano, J. G.
    Gonzalez, D.
    Mauder, Ch.
    Ambacher, O.
    JOURNAL OF CRYSTAL GROWTH, 2007, 300 (01) : 50 - 56
  • [6] Effect of Annealing on the Structural Electrical and Optical Properties of CdSe Thin Films
    Santhosh, T. C. M.
    Bangera, Kasturi, V
    Shivakumar, G. K.
    ADVANCED SCIENCE LETTERS, 2018, 24 (08) : 5700 - 5702
  • [7] Structural and electrical properties of HgTe thin films
    Seyam, MAM
    Elfalaky, A
    VACUUM, 2000, 57 (01) : 31 - 41
  • [8] Structural and Electrical Properties of Titania Thin Films
    Nadzirah, Sh.
    Hashim, U.
    Malihah, N.
    MICRO/NANO SCIENCE AND ENGINEERING, 2014, 925 : 300 - +
  • [9] Effect of physical ageing in thin glassy polymer films
    S. Kawana
    R.A.L. Jones
    The European Physical Journal E, 2003, 10 : 223 - 230
  • [10] Effect of physical ageing in thin glassy polymer films
    Kawana, S
    Jones, RAL
    EUROPEAN PHYSICAL JOURNAL E, 2003, 10 (03): : 223 - 230