TESTING CCD IMAGE SENSORS WITH ATE

被引：0
|
作者：
JAGIELA, ME
机构：
来源：
SOLID STATE TECHNOLOGY | 1986年 / 29卷 / 11期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：S36 / S39
页数：4
相关论文
共 50 条
  • [1] MEASUREMENT AND TESTING OF CCD SENSORS AND CAMERAS
    KUTZNER, J
    HIGHTOWER, L
    PRUITT, C
    [J]. SMPTE JOURNAL, 1992, 101 (05): : 325 - 328
  • [2] CCD IMAGE SENSORS AND ROBOTIC VISION
    BOARDMAN, CM
    [J]. LASER FOCUS-ELECTRO-OPTICS, 1984, 20 (03): : 132 - &
  • [3] Defect engineering in CCD image sensors
    McColgin, WC
    Shantharama, LG
    Lavine, JP
    [J]. DEFECT AND IMPURITY ENGINEERED SEMICONDUCTORS AND DEVICES III, 2002, 719 : 119 - 124
  • [4] The Comparison of CCD and CMOS Image Sensors
    Zhang, Lihua
    Jin, Yongjun
    Lin, Lin
    Li, Jijun
    Du, Yungang
    [J]. 2008 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: ADVANCED SENSOR TECHNOLOGIES AND APPLICATIONS, 2009, 7157
  • [5] Inexpensive image sensors challenge CCD supremacy
    Zarnowski, T
    Vogelsong, T
    Zarnowski, J
    [J]. PHOTONICS SPECTRA, 2000, 34 (05) : 188 - +
  • [6] Attainable Dynamic Range of CCD Image Sensors
    Ricny, Vaclav
    Kratochvil, Tomas
    Slanina, Martin
    [J]. PROCEEDINGS ELMAR-2010, 2010, : 47 - 49
  • [7] Extending the performance limits of CCD image sensors
    Burt, DJ
    [J]. GEC JOURNAL OF RESEARCH, 1995, 12 (03): : 130 - 140
  • [8] Investigation on the Interface of Polysilicon/Oxide in CCD Image Sensors
    Naiman, L.
    Renhao, L.
    Chunlin, L.
    [J]. SELECTED PAPERS FROM CONFERENCES OF THE PHOTOELECTRONIC TECHNOLOGY COMMITTEE OF THE CHINESE SOCIETY OF ASTRONAUTICS 2014, PT II, 2015, 9522
  • [9] CCD and CMOS Image Sensors in New HD Cameras
    Lustica, Alen
    [J]. 53RD INTERNATIONAL SYMPOSIUM ELMAR-2011, 2011, : 133 - 136
  • [10] A fast double shutter system for CCD image sensors
    Geisler, Reinhard
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2014, 25 (02)
12345