METHOD OF CONCENTRATION OF POWER IN MATERIALS FOR X-RAY AMPLIFICATION

被引:5
|
作者
BOYER, K
BORISOV, AB
BOROVSKIY, AV
SHIRYAEV, OB
TATE, DA
BOUMA, BE
SHI, X
MCPHERSON, A
LUK, TS
RHODES, CK
机构
[1] MV LOMONOSOV STATE UNIV,CTR RES COMP,COMP SIMULAT LAB,MOSCOW 119899,USSR
[2] ACAD SCI USSR,INST GEN PHYS,MOSCOW 117942,USSR
来源
APPLIED OPTICS | 1992年 / 31卷 / 18期
关键词
D O I
10.1364/AO.31.003433
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Recent experimental and theoretical results indicate that a new technique for the controlled concentration of power in materials may be feasible. The power levels that are potentially achievable are sufficient for the generation of amplification of x-ray wavelengths in the kilovolt range. The method of power concentration involves the combination of (1) a new ultrahigh brightness subpicosecond laser technology, (2) multiphoton coupling to atoms and molecules, and (3) a new channeled mode of electromagnetic propagation. The energy scaling of this approach is the most important consideration, and it is shown that the control of the propagation is the key factor that enables high levels of amplification in the kilovolt regime to be achieved with a total excitation energy of approximately 1 J.
引用
收藏
页码:3433 / 3437
页数:5
相关论文
共 50 条
  • [1] An x-ray method for determining the vacancy concentration
    Brusilovskii, BA
    Dryga, AI
    Shashko, AY
    INDUSTRIAL LABORATORY, 1998, 64 (12): : 796 - 799
  • [2] X-RAY DIFFRACTION METHOD OF EVALUATING THE CONCENTRATION OF DISLOCATION LOOPS IN STRONGLY IRRADIATED MATERIALS.
    Penteleyev, L.D.
    Deripasko, V.T.
    Physics of Metals and Metallography, 1980, 50 (02): : 129 - 134
  • [3] New X-ray diffraction method for materials science
    Swiatek, Z
    Bonarski, JT
    Ciach, R
    Kuznicki, ZT
    THIN SOLID FILMS, 1998, 319 (1-2) : 16 - 19
  • [4] An X-ray diffraction method for determination of cementite concentration in steel
    Brusilovskii, BA
    Shashko, AY
    INDUSTRIAL LABORATORY, 2000, 66 (07): : 460 - 461
  • [5] X-ray and x-ray electron spectroscopy of new materials
    V. I. Vovna
    E. P. Domashevskaya
    A. V. Okotrub
    Journal of Structural Chemistry, 2017, 58 : 1057 - 1060
  • [6] X-ray and x-ray electron spectroscopy of new materials
    Vovna, V. I.
    Domashevskaya, E. P.
    Okotrub, A. V.
    JOURNAL OF STRUCTURAL CHEMISTRY, 2017, 58 (06) : 1057 - 1060
  • [7] ANALYTIC METHOD OF INDEXING X-RAY PATTERNS OF POLYCRYSTALLINE MATERIALS
    VYRODOV, IP
    SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1964, 9 (03): : 316 - &
  • [8] A NEW METHOD FOR THE X-RAY INVESTIGATION OF THE STRUCTURE OF RADIOACTIVE MATERIALS
    KONOBEEVSKII, ST
    LEVITSKII, BM
    MARTYNIUK, IA
    SOVIET PHYSICS-TECHNICAL PHYSICS, 1956, 1 (04): : 856 - 859
  • [9] METHOD OF PROFILE REFINEMENT OF X-RAY AND ANALYSIS OF STRESS ON MATERIALS
    张志焜
    崔相旭
    李延琴
    吴登真
    张国铸
    ChineseScienceBulletin, 1990, (02) : 153 - 157
  • [10] METHOD OF PROFILE REFINEMENT OF X-RAY AND ANALYSIS OF STRESS ON MATERIALS
    ZHANG, ZK
    CUI, XX
    LI, YQ
    WU, DZ
    ZHANG, GZ
    CHINESE SCIENCE BULLETIN, 1990, 35 (02): : 153 - 157