共 50 条
- [1] AUGER-ELECTRON MICROSCOPY - AN OVERVIEW [J]. CZECHOSLOVAK JOURNAL OF PHYSICS, 1994, 44 (03) : 173 - 193
- [3] INSTRUMENTAL EFFECTS IN QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY [J]. VACUUM, 1984, 34 (05) : 497 - 507
- [5] INSTRUMENTAL CONSIDERATIONS FOR ACQUIRING QUANTITATIVE AUGER-ELECTRON SPECTRA [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (04): : 2309 - 2314
- [6] SYNCHRONOUS MODULATION IN SCANNING AUGER-ELECTRON MICROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (01): : 46 - 47
- [7] DIGITAL INTEGRATOR IN SCANNING AUGER-ELECTRON MICROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (01): : 95 - 97
- [9] COMBINED AUGER-ELECTRON SPECTROSCOPY AND SCANNING ELECTRON-MICROSCOPY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (05): : 435 - 438