GRAZING-INCIDENCE MOSSBAUER-SPECTROSCOPY - NEW METHOD FOR SURFACE-LAYERS ANALYSIS .1. INSTRUMENTATION

被引：37
|
作者：
IRKAEV, SM
ANDREEVA, MA
SEMENOV, VG
BELOZERSKII, GN
GRISHIN, OV
机构：
[1] MOSCOW MV LOMONOSOV STATE UNIV,DEPT PHYS,MOSCOW 117234,RUSSIA
[2] ST PETERSBURG STATE UNIV,DEPT GEOG,ST PETERSBURG 199164,RUSSIA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 74卷 / 04期
关键词：
D O I：
10.1016/0168-583X(93)95954-4
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The aims of this series of papers are to describe a spectrometer for simultaneous investigation of Mossbauer spectra from: (1) specularly reflected gamma-rays, (2) secondary electron, (3) characteristic X-ray, and (4) scattered gamma-rays (part I); to present a general theory of such spectra and to indicate some unusual characteristics and features of Mossbauer spectra at grazing angles (part II); and to give a quantitative analysis of experimental spectra for some Fe-57 films which shows that grazing incidence mossbauer spectroscopy (GIMS) is really a new method of surface investigation (part III).
引用
收藏
页码：545 / 553
页数：9
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