TEMPERATURE-DEPENDENT EBIC CONTRASTS OF GRAIN-BOUNDARIES AND SYSTEMS OF DISLOCATION LOOPS IN SI

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作者：
KOLBE, M
HOLLRICHER, O
GOTTSCHALK, H
ALEXANDER, H
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MICROSCOPY OF SEMICONDUCTING MATERIALS 1989 | 1989年 / 100卷
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T [工业技术];
学科分类号：
08 ;
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页码：725 / 730
页数：6
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