NUMERICAL SIMULATIONS OF ON AND OFF STATE CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORS

被引：0
|
作者：
HACK, M [1 ]
WU, IW [1 ]
LEWIS, AG [1 ]
KING, TJ [1 ]
机构：
[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1993年 / 40卷 / 11期
关键词：
D O I：
10.1109/16.239807
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
[No abstract available]
引用
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页码：2128 / 2128
页数：1
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