EFFECT OF ALLOYING ON THE VOID SWELLING IN CU-BASE AND AG-BASE ALLOYS

被引:0
|
作者
HASHIMOTO, M [1 ]
SAKA, H [1 ]
IMURA, T [1 ]
JITSUKAWA, S [1 ]
SUZUKI, K [1 ]
机构
[1] JAPAN ATOM ENERGY RES INST,TOKAI,IBARAKI 31611,JAPAN
来源
关键词
CRYSTALS - Microstructure - ELECTRON BEAMS - SILVER AND ALLOYS - Microscopic Examination;
D O I
10.1002/pssa.2211080115
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Pure Ag, pure Cu, and a variety of Cu-base and Ag-base solid solution alloy single crystal are irradiated with 1 MeV electrons in the high-voltage electron microscopes in a temperature range from 100 to 300 degree C, and void swelling behavior of these metals and alloys is studied. It is shown that in Ag-Al, Cu-Ge, and Cu-Si alloys void swelling is much smaller than in pure Ag, pure Cu, Ag-In, Ag-Sn, and Cu-Al alloys. In the former group a segregation of solute atoms at the sinks of point defects is induced by irradiation, while in the latter group either such a segregation is not induced, or a segregation of solvent atoms is induced by irradiation. Possible mechanisms for the suppression of void swelling in those alloys where a segregation of solute atoms is induced by irradiation are discussed.
引用
收藏
页码:163 / 170
页数:8
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