ACCELERATED AGING AND A UNIFORM MODE OF DEGRADATION IN (AI,GA) AS DOUBLE-HETEROSTRUCTURE LASERS

被引：40

作者：

DIXON, RW ^{[1
]}

HARTMAN, RL ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

JOURNAL OF APPLIED PHYSICS | 1977年 / 48卷 / 08期

关键词：

D O I：

10.1063/1.324226

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3225 / 3229

页数：5

共 50 条

[1] ACCELERATED FACET EROSION FORMATION AND DEGRADATION OF (AL, GA)AS DOUBLE-HETEROSTRUCTURE LASERS
NASH, FR
HARTMAN, RL
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1980, 16 (10) : 1022 - 1033
[2] ACCELERATED AGING OF (AL,GA) AS DOUBLE HETEROSTRUCTURE LASERS
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SCHUMAKER, NE
DIXON, RW
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (09) : 1216 - 1216
[3] ACCELERATED FACET DEGRADATION OF INGAASP INP DOUBLE-HETEROSTRUCTURE LASERS IN WATER
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TAKUSAGAWA, M
[J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : 4028 - 4037
[4] MIRROR DEGRADATION IN ALGAAS DOUBLE-HETEROSTRUCTURE LASERS
YONEZU, H
ENDO, K
KAMEJIMA, T
TORIKAI, T
YUASA, T
FURUSE, T
[J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (08) : 5150 - 5157
[5] GRADUAL DEGRADATION OF GAAS DOUBLE-HETEROSTRUCTURE LASERS
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RITCHIE, S
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1973, QE 9 (02) : 300 - 305
[6] STATISTICAL-ANALYSIS OF AGING-INDUCED DEGRADATION (OR LIFETIME) VARIATIONS IN (AL, GA)AS/GAAS DOUBLE-HETEROSTRUCTURE LASERS
MIZUISHI, K
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1983, 19 (03) : 457 - 465
[7] DEEP-LEVEL CHANGES IN (AL,GA)AS DOUBLE-HETEROSTRUCTURE LASERS DEGRADED DURING ACCELERATED AGING AT HIGH-TEMPERATURES
UJI, T
SUZUKI, T
KAMEJIMA, T
[J]. APPLIED PHYSICS LETTERS, 1980, 36 (08) : 655 - 657
[8] REFLECTIVITY OF MODE AT FACET AND OSCILLATION MODE IN DOUBLE-HETEROSTRUCTURE INJECTION LASERS
IKEGAMI, T
[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1972, QE 8 (06) : 470 - +
[9] FACET DEGRADATION OF INGAASP-INP DOUBLE-HETEROSTRUCTURE LASERS
MORIMOTO, M
IMAI, H
HORI, K
TAKUSAGAWA, M
FUKUDA, M
[J]. APPLIED PHYSICS LETTERS, 1980, 37 (12) : 1082 - 1084
[10] MICROSCALE DEGRADATION IN (GAAL)AS DOUBLE-HETEROSTRUCTURE DIODE-LASERS
KATO, D
[J]. APPLIED PHYSICS LETTERS, 1977, 31 (09) : 588 - 590

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