STATISTICAL-ANALYSIS OF X-RAY RESIDUAL-STRESS MEASUREMENT USING THE HALF-WIDTH METHOD

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KURITA, M

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JOURNAL OF TESTING AND EVALUATION | 1982年 / 10卷 / 02期

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TB3 [工程材料学];

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0805 ; 080502 ;

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页码：38 / 46

页数：9

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