ACCURACY AND SENSITIVITY OF X-RAY ANALYSIS WITH EXTERNAL STANDARDS

被引：4
|
作者：
PLESCH, R
机构：
来源：
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1972年 / 262卷 / 02期
关键词：
D O I：
10.1007/BF00425916
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
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页码：84 / &
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