DYNAMIC TESTING OF INTEGRATED CIRCUITS

被引：0
|
作者：
MCGAHEY, BH
THOMAS, EW
机构：
来源：
BELL LABORATORIES RECORD | 1971年 / 49卷 / 11期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The fast, critically timed digital systems now being designed for the telephone network will require close control of the dynamic characteristics of integrated circuits. A system built at Bell Laboratories shows that dynamic testing of beam- lead IC's is practical.
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页码：338 / &
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