EFFICIENT DETECTION OF SECONDARY ELECTRONS IN LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY

被引：19

|

作者：

ZACH, J

ROSE, H

机构：

来源：

SCANNING | 1986年 / 8卷 / 06期

关键词：

D O I：

10.1002/sca.4950080606

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：285 / 293

页数：9

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