ION MICROPROBE MEASUREMENTS OF CONCENTRATION DEPTH PROFILES OF ERBIUM OXIDE ON THIN-FILM ERBIUM METAL

被引：3
|
作者：
GUTHRIE, JW [1 ]
机构：
[1] SANDIA LABS,APPL PHYS DIV,ALBUQUERQUE,NM 87115
来源：
JOURNAL OF THE LESS-COMMON METALS | 1973年 / 30卷 / 02期
关键词：
D O I：
10.1016/0022-5088(73)90120-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：317 / 320
页数：4
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