COMPUTER-SIMULATION OF HIGH-RESOLUTION ELECTRON-MICROGRAPHS USING DYNAMICAL ELECTRON-SCATTERING

被引：12

|

作者：

KRAKOW, W

机构：

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1981年 / 25卷 / 01期

关键词：

D O I：

10.1147/rd.251.0058

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

30

引用

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页码：58 / 70

页数：13

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