MEASUREMENT OF MINORITY CARRIER LIFETIMES IN SEMICONDUCTORS

被引：3
|
作者：
DURRANT, NF
机构：
来源：
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B | 1955年 / 68卷 / 08期
关键词：
D O I：
10.1088/0370-1301/68/8/411
中图分类号：
Q [生物科学];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
引用
收藏
页码：562 / 563
页数：2
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