PREPARATION OF INTERMEDIATE THICKNESS SAMPLES FOR PIXE ANALYSIS - PRECISION AND ACCURACY OF A NEW CORRECTION METHOD FOR MATRIX EFFECTS

被引：0

作者：

ALOUPOGIANNIS, P ^{[1
]}

机构：

[1] UNIV LIEGE,INST PHYS NUCL EXPTL,B-4000 LIEGE,BELGIUM

来源：

ANALUSIS | 1987年 / 15卷 / 07期

关键词：

D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：347 / 354

页数：8

共 50 条

[1] METHOD OF CORRECTION FOR ABSORPTION MATRIX EFFECTS IN SAMPLES OF INTERMEDIATE THICKNESS IN EDXRF ANALYSIS
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[2] PIXE ANALYSIS OF SAMPLES OF INTERMEDIATE THICKNESS
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[5] ACCURACY OF THE EMISSION TRANSMISSION METHOD APPLIED IN XRF ANALYSIS ON INTERMEDIATE THICKNESS SAMPLES
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[7] A METHOD FOR THE DETERMINATION OF PROTON ENERGY-LOSS IN INTERMEDIATE THICKNESS SAMPLES BY PIXE MEASUREMENTS
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[8] Theoretical influence coefficients for correction of matrix effects in x-ray fluorescence analysis of intermediate-thickness samples
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[9] MATRIX EFFECTS IN PIXE ANALYSIS ON LIQUID SAMPLES WITH AN EXTERNAL BEAM
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[10] A NEW METHOD (METHOD OF ALPHA-PARAMETERS) FOR CORRECTING PIXE MEASUREMENTS FOR MATRIX EFFECTS IN INFINITELY THICK SAMPLES
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