Upper Record Values from Extended Exponential Distribution

被引：0

作者：

Kumar, Devendra ^{[1
]}

Dey, Sanku ^{[2
]}

机构：

[1] Cent Univ Haryana, Mahendergarh, India

[2] St Anthonys Coll, Shillong, Meghalaya, India

来源：

JOURNAL OF MODERN APPLIED STATISTICAL METHODS | 2018年 / 17卷 / 02期

关键词：

Record values; single moment; product moment; recurrence relations; extended exponential distribution; conditional expectation; characterization;

D O I：

10.22237/jmasm/1557149263

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

Some recurrence relations are established for the single and product moments of upper record values for the extended exponential distribution by Nadarajah and Haghighi (2011) as an alternative to the gamma, Weibull, and the exponentiated exponential distributions. Recurrence relations for negative moments and quotient moments of upper record values are also obtained. Using relations of single moments and product moments, means, variances, and covariances of upper record values from samples of sizes up to 10 are tabulated for various values of the shape parameter and scale parameter. A characterization of this distribution based on conditional moments of record values is presented.

引用

页数：17

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