RECENT PROGRESS IN SPECKLE METROLOGY

被引：0
|
作者：
YAMAGUCHI, I
机构：
来源：
INTERNATIONAL JOURNAL OF THE JAPAN SOCIETY FOR PRECISION ENGINEERING | 1992年 / 26卷 / 02期
关键词：
LASER INTERFEROMETRY; LASER SPECKLE; DEFORMATION MEASUREMENT; IMAGE PROCESSING; OPTICAL MEASUREMENT; STRAIN MEASUREMENT; OPTICAL ENCODERS;
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
Speckle patterns, which arise from random interference of laser light diffusely reflected from rough surfaces, can be utilized as random markings of the surface for noncontact and sensitive measurement of displacement and strain of the surface. After basic properties of the speckle patterns and their application fields are surveyed, recent progress in speckle methods aimed at displacement and strain measurement is discussed. The topics are concerned with speckle photography, electronic speckle correlation, and TV speckle interferometry. Examples of quantitative and automatic measurement using electronic signal processing in the above techniques are described.
引用
收藏
页码：89 / 95
页数：7
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