Bayesian Test Procedure of Lifetime Performance Index for Exponential Distribution under Progressive Type-II Censoring

The lifetime performance assessment is important in the service (or manufacturing) industries. Lifetime performance index C-L is used to measure the potential and performance of a process, where L is the lower specification limit. In this paper, firstly, we propose the critical interval and the Bayesian test for C-L to assess the lifetime performance of products based on the conjugate prior distribution and squared error loss function under the exponential distribution with the progressive type-II censored sample; secondly, an example is given to illustrate the use of the testing procedure under given significant level. Moreover, the new testing procedure is to determine whether the product performance adheres to the required level.