Structure perfection of bulk and near-surface layers in sapphire single crystals

被引：0
|
作者：
Tkachertko, V. F. [1 ]
Puzikov, V. M. [1 ]
Dan'ko, A. Ya [1 ]
Budnikov, A. T. [1 ]
Lukienko, O. A. [1 ]
机构：
[1] Natl Acad Sci Ukraine, STC Inst Single Crystals, Inst Single Crystals, 60 Lenin Ave, UA-61001 Kharkov, Ukraine
来源：
FUNCTIONAL MATERIALS | 2007年 / 14卷 / 04期
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D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing atmosphere by the Czochralski technique and machined and annealed in various manners.
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页码：550 / 554
页数：5
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