THICKNESS DEPENDENCE OF DIELECTRIC-BREAKDOWN VOLTAGE

被引：12

作者：

LHYMN, C

KOSEL, PB

VAUGHAN, R

机构：

[1] UNIV CINCINNATI,DEPT ELECT ENGN,CINCINNATI,OH 45221

[2] UNIV NEW S WALES,SCH ELECT ENGN,KENSINGTON,NSW 2033,AUSTRALIA

来源：

THIN SOLID FILMS | 1986年 / 145卷 / 01期

关键词：

D O I：

10.1016/0040-6090(86)90252-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：69 / 74

页数：6

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