CONFIDENCE-LIMITS FOR THE NUMBER OF DEFECTIVES IN A LOT

被引：2

|

作者：

TOMSKY, JL

NAKANO, K

IWASHIKA, M

机构：

来源：

JOURNAL OF QUALITY TECHNOLOGY | 1979年 / 11卷 / 04期

关键词：

D O I：

10.1080/00224065.1979.11980912

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：199 / 204

页数：6

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