SECONDARY EFFECTS IN PROMPT CHARGED-PARTICLE ACTIVATION-ANALYSIS

被引:4
|
作者
PEISACH, M [1 ]
PILLAY, AE [1 ]
机构
[1] UNIV WITWATERSRAND,DEPT CHEM,WITWATERSRAND 2050,SOUTH AFRICA
关键词
D O I
10.1007/BF02163639
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The phenomenon of secondary excitation was observed during irradiation of thick targets of boron and gallium nitride with 2 MeV He-3+ ions. This effect, though negligible during irradiation with protons or He-4+ ions, becomes significant when highly exoergic reactions can occur.
引用
收藏
页码:445 / 450
页数:6
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