SHORT-TIME OPTICAL VARIABILITY OF X-RAY SOURCES

被引:16
|
作者
AVNI, Y [1 ]
BAHCALL, JN [1 ]
机构
[1] INST ADV STUDY,SCH NAT SCI,PRINCETON,NJ 08540
来源
ASTROPHYSICAL JOURNAL | 1974年 / 191卷 / 01期
关键词
D O I
10.1086/152958
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
引用
收藏
页码:221 / 230
页数:10
相关论文
共 50 条
  • [1] The short-time variability of the supersoft X-ray source RX J0019.8+2156
    Meyer-Hofmeister, E
    Schandl, S
    Deufel, B
    Barwig, H
    Meyer, F
    [J]. ASTRONOMY & ASTROPHYSICS, 1998, 331 (02) : 612 - 618
  • [2] TIME VARIABILITY OF THE X-RAY SOURCES IN M33
    PERES, G
    REALE, F
    COLLURA, A
    FABBIANO, G
    [J]. ASTROPHYSICAL JOURNAL, 1989, 336 (01): : 140 - 151
  • [3] VARIABILITY OF CYGNUS X-RAY SOURCES
    FRANCEY, RJ
    [J]. NATURE-PHYSICAL SCIENCE, 1971, 229 (08): : 233 - &
  • [4] SPECTRAL VARIABILITY IN X-RAY SOURCES
    THOMAS, RM
    DULDIG, ML
    GREENHILL, JG
    [J]. NATURE, 1977, 267 (5609) : 332 - 333
  • [5] SEARCH FOR HIGH-FREQUENCY OPTICAL VARIABILITY IN X-RAY SOURCES
    RICHER, HB
    ULRYCH, TJ
    STEELE, JP
    AUMAN, JR
    ISHERWOOD, BC
    [J]. NATURE-PHYSICAL SCIENCE, 1972, 238 (87): : 131 - +
  • [6] X-RAY VARIABILITY IN TRANSIENT-X-RAY SOURCES
    DEMARTINO, D
    WATERS, LBFM
    HABETS, GMHJ
    TAYLOR, AR
    [J]. NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA C-GEOPHYSICS AND SPACE PHYSICS, 1990, 13 (02): : 471 - 479
  • [7] Correlated X-ray and optical variability in X-ray binaries
    Hynes, RI
    [J]. Astrophysics of Cataclysmic Variables and Related Objects, 2005, 330 : 237 - 250
  • [8] A STATISTICAL-METHOD OF REVEALING SHORT-TIME INSTABILITY OF X-RAY DIFFRACTOMETERS
    MARKOV, VT
    FETISOV, GV
    [J]. KRISTALLOGRAFIYA, 1986, 31 (05): : 851 - 858
  • [9] Short-Time In Vitro and In Vivo Precision of Direct Digital X-ray Radiogrammetry
    Hoff, Mari
    Dhainaut, Alvilde
    Kvien, Tore K.
    Forslind, Kristina
    Kalvesten, Johan
    Haugeberg, Glenn
    [J]. JOURNAL OF CLINICAL DENSITOMETRY, 2009, 12 (01) : 17 - 21
  • [10] Short soft x-ray sources
    Siciliano, M. V.
    Lorusso, A.
    Velardi, L.
    Nassisi, V.
    [J]. X-RAY SPECTROMETRY, 2009, 38 (06) : 544 - 547