DETERMINATION OF THE VALENCE CHARGE-DENSITY OF ELEMENTAL SEMICONDUCTORS AND COMPOUNDS-III-V WITH X-RAY-DIFFRACTION METHODS

被引：1

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作者：

BRUHL, HG

机构：

来源：

PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1981年 / 107卷 / 01期

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D O I：

10.1002/pssb.2221070130

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

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页码：289 / 295

页数：7

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