DETERMINATION OF THE LI/NI RATIO IN LIXNI1-XO THIN-FILMS BY PIXE-PIGE ANALYSIS

被引：1

作者：

BONI, C ^{[1
]}

CARIDI, A ^{[1
]}

CEREDA, E ^{[1
]}

MARCAZZAN, GMB ^{[1
]}

PARMIGIANI, F ^{[1
]}

SCAGLIOTTI, M ^{[1
]}

机构：

[1] UNIV MILAN,IST FIS GEN APPL,I-20122 MILAN,ITALY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 50卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90362-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Li/Ni ratios in LixNi1 - xO films were determined by simultaneous use of the PIXE (particle-induced X-ray emission) and PIGE (proton-induced gamma-ray emission) techniques using the 3.5 MeV proton beam provided by the CISE tandem Van de Graaff accelerator. The general features of the experimental setup are presented and discussed along with the results on the dependence of Li/Ni ratios on the e-beam evaporation and thermal treatments. Preliminary results obtained by XRD (X-ray diffraction) are also discussed. The combined use of PIXE and PIGE proves to be a unique opportunity for nondestructive measurement in thin films and, through the correlation with structural data, it allows a careful optimization of the deposition process and thermal treatment parameters to be obtained. © 1990.

引用

页码：243 / 246

页数：4

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