CRITERION-REFERENCED TESTS OF SCHOOL READINESS - PARADIGM WITH ILLUSTRATIONS

被引：0
|
作者：
HUNT, JM [1 ]
KIRK, GE [1 ]
机构：
[1] UNIV ILLINOIS, DEPT PSYCHOL, PSYCHOL DEV LAB, CHAMPAIGN, IL 61820 USA
来源：
GENETIC PSYCHOLOGY MONOGRAPHS | 1974年 / 90卷 / 01期
关键词：
D O I：
暂无
中图分类号：
B84 [心理学];
学科分类号：
04 ; 0402 ;
摘要：
引用
收藏
页码：143 / 182
页数：40
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