SURFACE STUDIES BY CORE-EXCITATION REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY

被引：4

作者：

HITCHCOCK, AP ^{[1
]}

TYLISZCZAK, T ^{[1
]}

机构：

[1] MCMASTER UNIV,INST MAT RES,HAMILTON,ON L8S 4M1,CANADA

来源：

SURFACE REVIEW AND LETTERS | 1995年 / 2卷 / 01期

关键词：

D O I：

10.1142/S0218625X95000054

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Inelastic electron scattering in a reflection geometry is a useful alternative to synchrotron radiation X-ray absorption spectroscopy for inner-shell excitation studies of surfaces. This article reviews the current capabilities of reflection electron energy loss spectroscopy for core-excitation studies of the electronic and geometric structure of surfaces. Issues discussed include: momentum transfer dependence, comparison to X-ray techniques, orientational sensitivity, spatial and energy resolution, and technological applications. Examples of applications to clean surfaces, atomic and molecular adsorbates, and thin films are given.

引用

页码：43 / 61

页数：19

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