PIXE AND MICRO-PIXE ANALYSIS OF MINERALS AT EP=40 MEV

被引：28

作者：

DUROCHER, JJG ^{[1
]}

HALDEN, NM ^{[1
]}

HAWTHORNE, FC ^{[1
]}

MCKEE, JSC ^{[1
]}

机构：

[1] UNIV MANITOBA,DEPT GEOL SCI,WINNIPEG R3T 2N2,MANITOBA,CANADA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 30卷 / 03期

关键词：

MINERALOGY - Analytical Methods - ORE ANALYSIS - RARE EARTH ELEMENTS - Spectroscopic Analysis - X-RAYS - Propagation;

D O I：

10.1016/0168-583X(88)90043-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Proton-induced X-ray emission (PIXE) analyis has been employed at the University of Manitoba Accelerator Center in the analysis of apatite samples containing trace amounts of rare earth elements (REE). Detection limits of 5 ppm or better were readily achieved for elements such as La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy and Yb. Qualitative results of an analysis of Durango apatite were compared with the published results of other authors and found to be in general agreement. The relative ease with which results might be extracted from K x-ray data obtained for medium high Z elements studied at the energy of the Manitoba accelerator is contrasted with data reduction techniques employed at lower energy PIXE facilities.

引用

页码：470 / 473

页数：4

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