ELECTRON CHANNELING ENHANCED MICROANALYSIS ON NI-AL-MN AND AL-MN-SI

被引：5
|
作者：
SHINDO, D
HIRAGA, K
TAKASUGI, T
TSAI, AP
机构：
[1] Institute for Materials Research, Tohoku University, Katahira
来源：
MATERIALS TRANSACTIONS JIM | 1990年 / 31卷 / 07期
关键词：
atom location by channelling enhanced microanalysis; energy dispersive X-ray spectrometer; Ni[!sub]3[!/sub]Al; quasicrystal; site determination; substitutional occupation;
D O I：
10.2320/matertrans1989.31.647
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Atom location by channelling enhanced microanalysis (ALCHEMI) was performed for Ni-Al-Mn compounds and Al-Mn-Si quasicrystals. For Ni75Al25-xMnx (x=5, 9) with the L12-type structure, an occupation fraction of Mn atoms at the Ni site was quantitatively determined using planar channelling conditions. The occupation fraction increases with the Mn concentration or by quenching the compound from high temperature. In quasicrystals of Al74Mn20Si6 and Al68Mn20Ru8Si4, axial channelling conditions were used to locate Si and Ru, respectively. It was shown that Si atoms occupy the Al site in Al74Mn20Si6 whereas Ru atoms occupy the site different from that of Al in Al68Mn20Ru8Si4. © 1990, The Japan Institute of Metals. All rights reserved.
引用
收藏
页码：647 / 651
页数：5
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