MICROPROCESSORS IN PRODUCTION MEASUREMENT TECHNOLOGY

被引:0
|
作者
DUTSCHKE, W
机构
关键词
D O I
暂无
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
引用
收藏
页码:759 / 761
页数:3
相关论文
共 50 条
  • [1] MEASUREMENT TECHNOLOGY IN PRODUCTION
    DUTSCHKE, W
    [J]. WERKSTATTSTECHNIK ZEITSCHRIFT FUR INDUSTRIELLE FERTIGUNG, 1979, 69 (07): : 428 - 430
  • [2] MICROPROCESSORS AND MOISTURE MEASUREMENT
    KAHN, DA
    [J]. MEASUREMENTS & CONTROL, 1994, (163): : 185 - 185
  • [3] PRODUCTION MEASUREMENT TECHNOLOGY IN MICROTECHNICS
    LAUERER, H
    RUOFF, W
    [J]. WERKSTATTSTECHNIK ZEITSCHRIFT FUR INDUSTRIELLE FERTIGUNG, 1987, 77 (02): : 104 - 107
  • [4] THE STATUS OF PRODUCTION MEASUREMENT TECHNOLOGY
    KAMPA, H
    [J]. WERKSTATTSTECHNIK ZEITSCHRIFT FUR INDUSTRIELLE FERTIGUNG, 1986, 76 (03): : 181 - 186
  • [5] DEVELOPMENTS IN PRODUCTION MEASUREMENT TECHNOLOGY
    WARNECKE, HJ
    DUTSCHKE, W
    LANG, H
    [J]. WERKSTATTSTECHNIK ZEITSCHRIFT FUR INDUSTRIELLE FERTIGUNG, 1977, 67 (05): : 263 - 267
  • [6] FinFET technology for future microprocessors
    Ludwig, T
    Aller, I
    Gernhoefer, V
    Keinert, J
    Nowak, E
    Joshi, RV
    Mueller, A
    Tomaschko, S
    [J]. 2003 IEEE INTERNATIONAL SOI CONFERENCE, PROCEEDINGS, 2003, : 33 - 34
  • [7] Compiler technology for future microprocessors
    Hwu, WMW
    Hank, RE
    Gallagher, DM
    Mahlke, SA
    Lavery, DM
    Haab, GE
    Gyllenhaal, JC
    August, DI
    [J]. PROCEEDINGS OF THE IEEE, 1995, 83 (12) : 1625 - 1640
  • [8] MICROPROCESSORS AND INTEGRATED ELECTRONIC TECHNOLOGY
    MOORE, GE
    [J]. PROCEEDINGS OF THE IEEE, 1976, 64 (06) : 837 - 841
  • [9] EMPLOYING MICROPROCESSORS FOR MEASUREMENT AND ANALYSIS
    DENNIS, U
    [J]. NUCLEAR ENGINEERING INTERNATIONAL, 1987, 32 (396): : 40 - 41
  • [10] MICROPROCESSORS IN POWER CABLE PRODUCTION
    RATIA, L
    [J]. WIRE JOURNAL INTERNATIONAL, 1983, 16 (09): : 46 - 46