X-RAY-DIFFRACTION IN FORENSIC-SCIENCE

被引：0

|

作者：

RENDLE, D ^{[1
]}

机构：

[1] METROPOLITAN POLICE FORENS SCI LAB,LONDON SE1 7LP,ENGLAND

来源：

MICROSCOPE | 1979年 / 27卷 / 3-4期

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中图分类号：

TH742 [显微镜];

学科分类号：

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页码：163 / 163

页数：1

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