LOW RESOLUTION SLIT-SCAN PATTERN-RECOGNITION APPLYING ONE-DIMENSIONAL MULTI-PARAMETER ANALYSIS

被引：0

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作者：

BETZ, JW

SENGBUSCH, GV

HARTEL, W

机构：

来源：

PATTERN RECOGNITION | 1981年 / 13卷 / 01期

关键词：

D O I：

10.1016/0031-3203(81)90036-4

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

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页码：89 / 93

页数：5

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