COMPTON X-RAY BACKSCATTER DEPTH PROFILOMETRY FOR AIRCRAFT CORROSION INSPECTION

被引:0
|
作者
LAWSON, L
机构
关键词
AIRCRAFT; COMPTON EFFECT; CORROSION; LAYERED MEDIUM; NONDESTRUCTIVE EVALUATION; THICKNESS MEASUREMENT; X-RADIOGRAPHY;
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A new technique for detecting and measuring second-layer corrosion and metal loss in aircraft using Compton backscattered X-rays is presented. This technique gives a cross-sectional (through the thickness) view of aircraft sheet metal lay-ups and joints. It allows micrometer-accuracy dimensional measurements to be made as well as material identification of sub-surface (second) layers. This technique requires access to only one side of the structure; it is not a transmission (shadow casting) technique. Measurement accuracy to 0.025 mm (0.001 in.) has been demonstrated. Relative to other X-ray techniques, this depth profiling technique generates little ambient x-radiation. Hangar activities can continue uninterrupted in the vicinity of its use.
引用
收藏
页码:936 / 941
页数:6
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