EXTENDED ANALYSIS OF THE SPECTRUM SI-XI - COMPILATION PLUS NEW MEASUREMENTS

被引：12
|
作者：
KRAMIDA, AE [1 ]
TRABERT, E [1 ]
机构：
[1] RUHR UNIV BOCHUM, D-44780 BOCHUM, GERMANY
来源：
PHYSICA SCRIPTA | 1995年 / 51卷 / 02期
关键词：
D O I：
10.1088/0031-8949/51/2/011
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The literature data on Si XI (Be-like ion) have been compiled with a critical re-analysis for their consistency. High-resolution EW beam-foil spectra provided new data. With the help of Cowan code ab initio and parametric calculations and of isoelectronic comparisons a revised level scheme was constructed which includes most levels up to configurations with principal quantum number n = 5, as well as some n = 6 levels. About 200 spectral lines in the region 30-613 Angstrom are newly identified with transitions between configurations with n = 2, 3, 4, 5 and 6.
引用
收藏
页码：209 / 226
页数：18
相关论文
共 24 条
  • [1] Extended analysis of the spectrum SiXi. Compilation plus new measurements
    [J]. Phys Scr, 2 (209):
  • [2] A critical compilation and extended analysis of the NeIV spectrum
    Kramida, AE
    Bastin, T
    Biémont, E
    Dumont, PD
    Garnir, HP
    [J]. EUROPEAN PHYSICAL JOURNAL D, 1999, 7 (04): : 525 - 546
  • [3] A critical compilation and extended analysis of the Ne V spectrum
    A.E. Kramida
    T. Bastin
    E. Biémont
    P.-D. Dumont
    H.-P. Garnir
    [J]. The European Physical Journal D - Atomic, Molecular, Optical and Plasma Physics, 1999, 7 : 547 - 565
  • [4] A critical compilation and extended analysis of the Ne IV spectrum
    A.E. Kramida
    T. Bastin
    E. Biémont
    P.-D. Dumont
    H.-P. Garnir
    [J]. The European Physical Journal D - Atomic, Molecular, Optical and Plasma Physics, 1999, 7 (4): : 525 - 546
  • [5] Revised and extended analysis of the spectrum of ten-times-ionized cerium (Ce XI)
    Joshi, YN
    Ryabtsev, AN
    Churilov, SS
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2001, 18 (12) : 1935 - 1942
  • [6] EXTENDED ANALYSIS AND NEW IDENTIFICATIONS IN SPECTRUM OF NE 2
    PERSSON, W
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1969, 59 (03) : 285 - &
  • [7] A NEW ANALYSIS AND ADDITIONAL MEASUREMENTS OF THE MILLIMETER AND SUBMILLIMETER SPECTRUM OF METHANOL
    HERBST, E
    MESSER, JK
    DELUCIA, FC
    HELMINGER, P
    [J]. JOURNAL OF MOLECULAR SPECTROSCOPY, 1984, 108 (01) : 42 - 57
  • [8] Application of a new ray tracing framework to the analysis of extended regions in Si solar cell modules
    Holst, Hendrik
    Winter, Matthias
    Vogt, Malte R.
    Bothe, Karsten
    Koentges, Marc
    Brendel, Rolf
    Altermatt, Pietro P.
    [J]. PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS (SILICONPV 2013), 2013, 38 : 86 - 93
  • [9] An analysis of the results of measurements of the fine-structure constant and their effect on the new definitions of the SI units
    V. D. Ivashchuk
    S. A. Kononogov
    V. N. Melnikov
    [J]. Measurement Techniques, 2011, 54 : 887 - 892
  • [10] AN ANALYSIS OF THE RESULTS OF MEASUREMENTS OF THE FINE-STRUCTURE CONSTANT AND THEIR EFFECT ON THE NEW DEFINITIONS OF THE SI UNITS
    Ivashchuk, V. D.
    Kononogov, S. A.
    Melnikov, V. N.
    [J]. MEASUREMENT TECHNIQUES, 2011, 54 (08) : 887 - 892
123