WAVE-GUIDE RAMAN-SPECTROSCOPY OF TIO2SIO2 THIN-FILMS

被引：26

作者：

BAHTAT, M ^{[1
]}

MUGNIER, J ^{[1
]}

BOVIER, C ^{[1
]}

ROUX, H ^{[1
]}

SERUGHETTI, J ^{[1
]}

机构：

[1] UNIV LYON 1,PHYSICOCHIM MAT LUMINESCENTS,URA 442,F-69622 VILLEURBANNE,FRANCE

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1992年 / 147卷

关键词：

D O I：

10.1016/S0022-3093(05)80604-0

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Planar monomode TiO2:SiO2 waveguides were prepared by the sol-gel method from Liquicoat solutions supplied by Merck. Waveguide Raman spectroscopy was used to study TiO2:SiO2 thin films with different TiO2:SiO2 Mixture ratios. The effect of annealing temperature on the microstructure of the films was followed up to 600-degrees-C. The amorphous phase crystallizes as anatase when the annealing temperature increases but Ti4+ ions remain in the silica network.

引用

页码：123 / 126

页数：4

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