共 2 条
- [1] Surface Electrical Conductivity Measurement System with Micro-Four-Point Probes at Sub-Kelvin Temperature under High Magnetic Field in Ultrahigh Vacuum [J]. E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY, 2012, 10 : 454 - 458
- [2] Ultrahigh vacuum, variable temperature, dual scanning tunneling microscope system operating under high magnetic field [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (06):