Surface Electrical Conductivity Measurement System with Micro-Four-Point Probes at Sub-Kelvin Temperature under High Magnetic Field in Ultrahigh Vacuum

被引:25
|
作者
Yamada, Manabu [1 ]
Hirahara, Toru [1 ]
Hobara, Rei [1 ]
Hasegawa, Shuji [1 ]
Mizuno, Hiroyuki [2 ]
Miyatake, Yutaka [2 ]
Nagamura, Toshihiko [2 ]
机构
[1] Univ Tokyo, Grad Sch Sci, Dept Phys, Bunkyo Ku, Hongo 7-3-1, Tokyo 1130033, Japan
[2] UNISOKU Co Ltd, Hirakata, Osaka 5730131, Japan
基金
日本学术振兴会;
关键词
Surface-state superconductivity; Micro-four-point probe; Surface electrical transport; Dual configuration method; In; Si(111);
D O I
10.1380/ejssnt.2012.400
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have constructed an ultrahigh vacuum system in which surface conductivity is measured in situ by micro four -point probe method down to 0.8 K, combined with conventional surface preparation/analysis capability. In order to reduce the data scattering due to changes of the probe spacing, we have employed a dual configuration method in which the combinations with current/voltage probes are switched. The surface-state superconductivity of Si(111)-\/77 x '0-In surface superstructure was confirmed with the critical temperature of 2.8 K. The critical magnetic field was 0.3-0.4 T in the surface-normal direction.
引用
收藏
页码:400 / 405
页数:6
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