MEAN FREE-PATH AND DENSITY OF CONDUCTANCE ELECTRONS IN PLATINUM DETERMINED BY THE SIZE EFFECT IN EXTREMELY THIN-FILMS

被引：117

作者：

FISCHER, G ^{[1
]}

HOFFMANN, H ^{[1
]}

VANCEA, J ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

PHYSICAL REVIEW B | 1980年 / 22卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.22.6065

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：6065 / 6073

页数：9

共 23 条

[1] CALCULATION OF AVERAGE ELECTRON MEAN FREE-PATH FOR METALLIC THIN-FILMS
CHEN, CX
JOURNAL OF MATERIALS SCIENCE LETTERS, 1987, 6 (02) : 232 - 234
[2] MEAN FREE-PATH AND EFFECTIVE DENSITY OF CONDUCTION ELECTRONS IN POLYCRYSTALLINE METAL-FILMS
VANCEA, J
HOFFMANN, H
KASTNER, K
THIN SOLID FILMS, 1984, 121 (03) : 201 - 216
[3] SCATTERING TIMES AND MEAN FREE-PATH IN ALCUFE QUASI-CRYSTALLINE THIN-FILMS
KLEIN, T
SYMKO, OG
PAULSEN, C
PHYSICAL REVIEW B, 1995, 51 (18): : 12805 - 12808
[4] SURFACE PHOTOCHEMICAL DETERMINATION OF THE MEAN FREE-PATH OF SUBVACUUM ELECTRONS IN ADSORBATE FILMS
UKRAINTSEV, VA
HARRISON, I
SURFACE SCIENCE, 1992, 276 (1-3) : 325 - 332
[5] EFFECT OF THICKNESS OF THIN METAL FILMS ON THE MEAN FREE PATH OF CONDUCTION ELECTRONS
CRITTENDEN, EC
LAYER, EH
HOFFMAN, RW
PHYSICAL REVIEW, 1952, 86 (04): : 657 - 657
[6] SURFACE PHOTOCHEMICAL DETERMINATION OF THE MEAN FREE-PATH OF SUBVACUUM ELECTRONS THROUGH ADSORBATE FILMS
UKRAINTSEV, VA
HARRISON, I
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1992, 204 : 211 - PHYS
[7] MEAN FREE PATH OF SLOW ELECTRONS IN THIN CdS FILMS.
Komolov, S.A.
Gerasimova, N.B.
Soviet Physics, Solid State (English translation of Fizika Tverdogo Tela), 1978, 20 (12): : 2062 - 2063
[8] HALL-COEFFICIENT OF THIN-FILMS IN A MEAN FREE PATH MODEL
TELLIER, CR
TOSSER, AJ
RABEL, M
JOURNAL OF PHYSICS F-METAL PHYSICS, 1978, 8 (11): : 2357 - 2365
[9] PHOTOGALVANIC EFFECT, DIFFUSION AND DRIFT OF THE NON-EQUILIBRIUM ELECTRONS WITH FINITE MEAN FREE-PATH
STURMAN, BI
ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI, 1982, 83 (05): : 1930 - 1940
[10] THE INELASTIC MEAN FREE PATHS OF AUGER ELECTRONS IN THIN-FILMS OF COPPER AND NICKEL
BURKE, MA
SCHREURS, JJ
SURFACE AND INTERFACE ANALYSIS, 1982, 4 (02) : 42 - 46

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